Scope:
Electrical and electronic products/electronic semiconductor products, nonhermetic surface mount devices /electronic semiconductor products, mainly contains steady-state temperature-humidity test, temperature cycle test, temperature storage test, visual inspection of appearance, Decap, Delayer, IV CURVE, InGaAs/OBRICH, PROBE, SAT, Pre-condition test, temperature and humidity bias test, high temperature bias test, high temperature storage test, high acceleration stress test, autoclave test, temperature cycle test.
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